Two images obtained with the high voltage electron microscope. Left, contour lines show the difference in electron density between free atoms and bonded atoms in a chromium crystal. Right, a crack in an aluminum-graphite fiber composite at the fiber/graphite interface.
Left, an ARM image of an interstellar diamond particle extracted from a meteorite. The inset curves compare electron energy loss spectra of this material (blue curve) with other types of carbon such as graphite (red), and natural diamond (green), providing clues to the origin of these particles. Right, high voltage electron micrograph showing semiconductor device that has failed due to a defect, seen as a thin curved black line, providing a short circuit between contact strips (seen as broad, dark bands).