"Materials Reliability in MEMS Devices," Transducers '97, p. 591-593, 1997 (Stuart Brown, Christopher Muhlstein and Will Van Arsdell).

"Microelectromechanical Systems for Materials Research," Volume 518, Materials Research Society, 1998 (S. Brown, J. Gilbert, H. Guckel, R. Howe, G. Johnson, P. Krulevich, and C. Muhlstein)

High-cycle fatigue of polycrystalline silicon thin films in laboratory air by C.L. Muhlstein, S.B. Brown, and R.O. Ritchie. MRS Symposium Proceedings, 2000

High-cycle fatigue and durability of polycrystalline silicon thin films in ambient air by C.L. Muhlstein, S.B. Brown, and R.O. Ritchie. Sensors Actuators A (Physical), 2001

High-cycle fatigue of single crystal silicon thin films by C. L. Muhlstein, S. Brown, and R. O. Ritchie, JMEMS, 2001

Mechanism of Fatigue in Micron-Scale Films of Polycrystalline Silicon for Microelectromechanical Systems by C. L. Muhlstein, E. A. Stach and R. O. Ritchie, Applied Physics Letters, vol. 80 (9), Mar. 4, 2002, pp.1532-1534

A Reaction-Layer Mechanism for the Delayed Failure of Micron-Scale Polycrystalline Silicon Structural Films Subjected to High-Cycle Fatigue Loading by C. L. Muhlstein, E. A. Stach and R. O. Ritchie, Acta Materialia, vol. 50, 2002, pp. 3579-3595 

High-Cycle Fatigue of Micron-Scale Polycrystalline Silicon Films: Fracture Mechanics Analysis of the Role of the Silicon/Silica Interface by C. L. Muhlstein and R. O. Ritchie, International Journal of Fracture, vol. 119/120, 2003, pp. 449-474

"High-Cycle Fatigue Failure of Micron-Scale Polycrystalline Silicon Films for MEMS", DOE review poster, 2002, C. L. (Muhlstein, E. A. Stach and R. O. Ritchie)

Failure of Silicon: Crack Formation and Propagation (presentation at 13^th Crystalline Silicon Solar Cell Workshop----Vail, Colorado, August 2003)