- Microwave near field microscopy
- Improved spatial resolution without loss of sensitivity
Scientists at Berkeley Lab have developed a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy that is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity, overcoming the typical loss of sensitivity with improved spatial resolution in near field microwave microscopes.
For more information, see Issued U.S. Patent 5,821,410.
STATUS: Issued U.S. Patent 5,821,410. Available for licensing or collaborative research.
REFERENCE NUMBER: IB-1183
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