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Study and Modification of Surface Properties with an Atomic Force Microscope

JIB-2653

APPLICATIONS OF TECHNOLOGY:

ADVANTAGES:

ABSTRACT:

A scientific team, including researchers at Berkeley Lab, has invented a device for the study and modification of surface properties and surface-proximal properties. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photoemission spectroscopy (XPS, XAS), and material modification by local exposure are executed either in sequence or simultaneously using the device.

STATUS: Published patent application # WO/2009/074617 available at www.wipo.int.  Available for licensing or collaborative research.

REFERENCE NUMBER: JIB-2653

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